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35 - 65 kHz DESCRIPTION
the supploed sample modulus is nominal and may change with sample aging
and PF TUNA packages
providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties
ESPA-V2 293 kHz 35 - 65 kHz DESCRIPTION0. 2N m, 13kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, ESP ESPA AFM probes. Brukers new line of ESP high quality premiumetched silicon probes set the industry standard for contact mode in air. The new design
